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Challenges
You would like to seamlessly improve your sort performance in an MF COBOL Enterprise Server, Server Express, Net Express, or COBOL Workbench environment; i.e., without making any changes to your programs.
You may also want a callable sort utility or API library for embedded data transformation and reporting to offload certain COBOL program bottlenecks.
You may also need solutions for data classification, data discovery, data cleansing, data masking, and synthetic test data using Micro Focus COBOL sources of copybook layouts, and are looking for a single vendor who can address multiple issues like these. See https://www.iri.com/solutions and other jobs IRI customers can perform affordably below:
Solutions
IRI's CoSort package includes libraries that hook seamlessly to Micro Focus COBOL on Unix and Windows systems, improving the native sort speeds up to 6 times with no source code changes.
MF COBOL users can also call CoSort utility programs or APIs to improve sorting, transformation, and reporting performance -- as well as IRI data masking and synthetic test data jobs -- directly from applications written in MF COBOL.
CoSort collates, converts, and creates MF COBOL Variable Length records, MF-ISAM, and Vision index file format, to and from other file formats.
CoSort and NextForm tools can also process and convert ACUCOBOL, Micro Focus, and RM COBOL data types (including packed and zoned decimal). Convert between these types and to and from other data types such as ASCII, Numeric and Unicode.
CoSort leverages your existing metadata and saves time in the creation of SortCL job scripts through a file dictionary (FD) translation utility called 'cob2ddf.' Short for COBOL-to-DDF, this free command line utility converts copybook descriptions into the equivalent data definition file (.DDF) layouts.
Incorporate and re-use DDF metadata in:
- IRI CoSort for data transformation and reporting
- IRI NextForm for data migration and replication
- IRI FieldShield for PII discovery and data masking
- IRI RowGen for safe and intelligent test data generation
